2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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9781728109404
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

TCAD Framework to Estimate the NBTI Degradation in FinFET and GAA NSFET Under Mechanical Strain

2019 ◽  
Author(s):  
Ravi Tiwari ◽  
Narendra Parihar ◽  
Karansingh Thakor ◽  
Hiu-Yung Wong ◽  
Souvik Mahapatra
Keyword(s):  
Mechanical Strain

RF performance improvement on 22FDX® platform and beyond

2019 ◽  
Author(s):  
Tom Herrmann ◽  
Alban Zaka ◽  
Nandha Kumar Subramani ◽  
Zhixing Zhao ◽  
Steffen Lehmann ◽  
...  
Keyword(s):  
Performance Improvement ◽  
Rf Performance

Investigation and Modelling of Single-Molecule Organic Transistors

2019 ◽  
Author(s):  
Fabrizio Torricelli ◽  
Eleonora Macchia ◽  
Paolo Romele ◽  
Kyriaki Manoli ◽  
Cinzia Di Franco ◽  
...  
Keyword(s):  
Single Molecule ◽  
Organic Transistors

Progress in dislocation stress field model and its appications

2019 ◽  
Author(s):  
Uihui Kwon ◽  
Jeong-Guk Min ◽  
Seon-Young Lee ◽  
Alexander Schmidt ◽  
Dae Sin Kim ◽  
...  
Keyword(s):  
Stress Field ◽  
Field Model ◽  
Dislocation Stress

scholarly journals DFT study of graphene doping due to metal contacts

2019 ◽  
Author(s):  
P. Khakbaz ◽  
F. Driussi ◽  
A. Gambi ◽  
P. Giannozzi ◽  
S. Venica ◽  
...  
Keyword(s):  
Dft Study ◽  
Metal Contacts ◽  
Graphene Doping
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