Two competing limiters in MOSFETs scaling: Neutral defects and S/D plasmons

2016 IEEE Silicon Nanoelectronics Workshop (SNW) ◽

10.1109/snw.2016.7577971 ◽

2016 ◽

Author(s):

Shang-Hsun Hsieh ◽

Jo-Chun Hung ◽

Heng-Jui Weng ◽

Ming-Fu Tsai ◽

Chih-Chi Chiang ◽

...

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