Testing for systematic defects based on DFM guidelines

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437603 ◽

2007 ◽

Author(s):

Dongok Kim ◽

M. Enamul Amyeen ◽

Srikanth Venkataraman ◽

Irith Pomeranz ◽

Swagato Basumallick ◽

...

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