2007 IEEE International Test Conference
Latest Publications

TOTAL DOCUMENTS

157

(FIVE YEARS 0)

H-INDEX

17

(FIVE YEARS 0)

Published By IEEE

9781424411276

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Call for papers

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437555 ◽

2007 ◽

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How much insurance can you afford?

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437681 ◽

2007 ◽

Author(s):

Bruce Cory

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Testing for systematic defects based on DFM guidelines

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437603 ◽

2007 ◽

Author(s):

Dongok Kim ◽

M. Enamul Amyeen ◽

Srikanth Venkataraman ◽

Irith Pomeranz ◽

Swagato Basumallick ◽

...

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Management of common-mode currents in semiconductor ATE

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437619 ◽

2007 ◽

Author(s):

William J. Bowhers

Keyword(s):

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A matched expansion MEMS probe card with low CTE LTCC substrate

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437618 ◽

2007 ◽

Author(s):

Seong-Hun Choe ◽

Shuji Tanaka ◽

Masayoshi Esashi

Keyword(s):

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Gate delay ratio model for unified path delay analysis

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437592 ◽

2007 ◽

Author(s):

Yukio Okuda

Keyword(s):

Delay Analysis ◽

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Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437591 ◽

2007 ◽

Author(s):

Zahi Abuhamdeh ◽

Vincent D'Alassandro ◽

Richard Pico ◽

Dale Montrone ◽

Alfred Crouch ◽

...

Keyword(s):

Temperature Effects ◽

Ring Oscillator ◽

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Advancements in at-speed array BIST: multiple improvements

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437566 ◽

2007 ◽

Author(s):

Kevin Gorman ◽

Michael Roberge ◽

Adrian Paparelli ◽

Gary Pomichter ◽

Stephen Sliva ◽

...

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How can the results of silicon debug justify the investment in design-for- debug infrastructure?

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437682 ◽

2007 ◽

Author(s):

Bob Gottlieb

Keyword(s):

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On ATPG for multiple aggressor crosstalk faults in presence of gate delays

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437563 ◽

2007 ◽

Author(s):

Kunal P. Ganeshpure ◽

Sandip Kundu

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