2007 IEEE International Test Conference
Latest Publications

TOTAL DOCUMENTS

157

(FIVE YEARS 0)

H-INDEX

17

(FIVE YEARS 0)

Published By IEEE

9781424411276

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Call for papers

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437555 ◽

2007 ◽

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ITC 2006 paper awards

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437552 ◽

2007 ◽

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Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437591 ◽

2007 ◽

Cited By ~ 18

Author(s):

Zahi Abuhamdeh ◽

Vincent D'Alassandro ◽

Richard Pico ◽

Dale Montrone ◽

Alfred Crouch ◽

...

Keyword(s):

Temperature Effects ◽

Ring Oscillator ◽

Ir Drop

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Advancements in at-speed array BIST: multiple improvements

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437566 ◽

2007 ◽

Cited By ~ 1

Author(s):

Kevin Gorman ◽

Michael Roberge ◽

Adrian Paparelli ◽

Gary Pomichter ◽

Stephen Sliva ◽

...

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How can the results of silicon debug justify the investment in design-for- debug infrastructure?

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437682 ◽

2007 ◽

Author(s):

Bob Gottlieb

Keyword(s):

Silicon Debug

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On ATPG for multiple aggressor crosstalk faults in presence of gate delays

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437563 ◽

2007 ◽

Cited By ~ 7

Author(s):

Kunal P. Ganeshpure ◽

Sandip Kundu

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ITC 2007 panel session the new ATE: Protocol aware

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437689 ◽

2007 ◽

Author(s):

Andrew C. Evans

Keyword(s):

Panel Session

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GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437666 ◽

2007 ◽

Cited By ~ 38

Author(s):

Michael Nicolaidis

Keyword(s):

Fault Tolerant ◽

Design Paradigm ◽

Fault Tolerant Design

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How much insurance can you afford?

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437681 ◽

2007 ◽

Author(s):

Bruce Cory

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Testing for systematic defects based on DFM guidelines

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437603 ◽

2007 ◽

Cited By ~ 3

Author(s):

Dongok Kim ◽

M. Enamul Amyeen ◽

Srikanth Venkataraman ◽

Irith Pomeranz ◽

Swagato Basumallick ◽

...

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