EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624679 ◽

2018 ◽

Author(s):

Andrew Stern ◽

Ulbert Botero ◽

Bicky Shakya ◽

Haoting Shen ◽

Domenic Forte ◽

...

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