2018 IEEE International Test Conference (ITC)
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72
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6
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Published By IEEE

9781538683828
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs

2018 ◽  
Author(s):  
Leonidas Katselas ◽  
Alkis Hatzopoulos ◽  
Hailong Jiao ◽  
Christos Papameletis ◽  
Erik Jan Marinissen
Keyword(s):  
On Chip

EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

2018 ◽  
Author(s):  
Andrew Stern ◽  
Ulbert Botero ◽  
Bicky Shakya ◽  
Haoting Shen ◽  
Domenic Forte ◽  
...  

Electrical Modeling of STT-MRAM Defects

2018 ◽  
Author(s):  
Lizhou Wu ◽  
Mottaqiallah Taouil ◽  
Siddharth Rao ◽  
Erik Jan Marinissen ◽  
Said Hamdioui
Keyword(s):  
Electrical Modeling

Variation-Aware Hardware Trojan Detection through Power Side-channel

2018 ◽  
Author(s):  
Fakir Sharif Hossain ◽  
Michihiro Shintani ◽  
Michiko Inoue ◽  
Alex Orailoglu
Keyword(s):  
Side Channel ◽  
Hardware Trojan ◽  
Hardware Trojan Detection ◽  
Trojan Detection
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