2018 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

72

(FIVE YEARS 0)

H-INDEX

6

(FIVE YEARS 0)

Published By IEEE

9781538683828

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips*

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624847 ◽

2018 ◽

Author(s):

Ling Zhang ◽

Zipeng Li ◽

Krishnendu Chakrabarty

Keyword(s):

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On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624803 ◽

2018 ◽

Author(s):

Leonidas Katselas ◽

Alkis Hatzopoulos ◽

Hailong Jiao ◽

Christos Papameletis ◽

Erik Jan Marinissen

Keyword(s):

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EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624679 ◽

2018 ◽

Author(s):

Andrew Stern ◽

Ulbert Botero ◽

Bicky Shakya ◽

Haoting Shen ◽

Domenic Forte ◽

...

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IJTAG Integrity Checking with Chained Hashing

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624777 ◽

2018 ◽

Author(s):

Senwen Kan ◽

Jennifer Dworak

Keyword(s):

Integrity Checking

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Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624819 ◽

2018 ◽

Author(s):

Arjun Chaudhuri ◽

Krishnendu Chakrabarty

Keyword(s):

Process Variations

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On Close-to-Functional Test Sequences

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624703 ◽

2018 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Functional Test

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Electrical Modeling of STT-MRAM Defects

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624749 ◽

2018 ◽

Author(s):

Lizhou Wu ◽

Mottaqiallah Taouil ◽

Siddharth Rao ◽

Erik Jan Marinissen ◽

Said Hamdioui

Keyword(s):

Electrical Modeling

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Variation-Aware Hardware Trojan Detection through Power Side-channel

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624866 ◽

2018 ◽

Author(s):

Fakir Sharif Hossain ◽

Michihiro Shintani ◽

Michiko Inoue ◽

Alex Orailoglu

Keyword(s):

Side Channel ◽

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection

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ITC 2018 Keynote Address Tuesday

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624898 ◽

2018 ◽

Keyword(s):

Keynote Address

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ITC 2018 TOC

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624730 ◽

2018 ◽

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