NBTI Degradation: A Problem or a Scare?

21st International Conference on VLSI Design (VLSID 2008) ◽

10.1109/vlsi.2008.43 ◽

2008 ◽

Author(s):

Kewal K. Saluja ◽

Shriram Vijayakumar ◽

Warin Sootkaneung ◽

Xaingning Yang

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