ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Building yield into systems-on chips for nanometer technologies
Proceedings. 21st VLSI Test Symposium, 2003.
◽
10.1109/vtest.2003.1197624
◽
2005
◽
Author(s):
P. Magarshack
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close