ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
A test interface for built-in test of non-isolated scanned cores
Proceedings. 21st VLSI Test Symposium, 2003.
◽
10.1109/vtest.2003.1197677
◽
2003
◽
Author(s):
I. Porneranz
◽
S.M. Reddy
◽
Y. Zorian
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close