Improving Gate-Level ATPG by Traversing Concurrent EFSMs

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.39 ◽

2006 ◽

Cited By ~ 3

Author(s):

G. Di Guglielmo ◽

F. Fummi ◽

C. Marconcini ◽

G. Pravadelli