Innovative Practices on In-System Test and Reliability of Memories

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758675 ◽

2019 ◽

Author(s):

S. Bandyopadhyay ◽

J. Mekkoth ◽

M. Hutner ◽

H. Grigoryan ◽

A. Kumar S. Shoukourian ◽

...

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