2019 IEEE 37th VLSI Test Symposium (VTS)
Latest Publications

TOTAL DOCUMENTS

55

(FIVE YEARS 55)

H-INDEX

3

(FIVE YEARS 3)

Published By IEEE

9781728111704

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Layered-ECC: A Class of Double Error Correcting Codes for High Density Memory Systems

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758647 ◽

2019 ◽

Author(s):

Abhishek Das ◽

Nur A. Touba

Keyword(s):

Memory Systems ◽

Error Correcting Codes ◽

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Innovative Practices on IEEE 1687.xyz

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758629 ◽

2019 ◽

Author(s):

Jeff Rearick ◽

Alfred Crouch ◽

Hans Martin Von Staudt

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Innovative Practices on In-System Test and Reliability of Memories

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758675 ◽

2019 ◽

Author(s):

S. Bandyopadhyay ◽

J. Mekkoth ◽

M. Hutner ◽

H. Grigoryan ◽

A. Kumar S. Shoukourian ◽

...

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Cache Design for Yield-per-Area Maximization: Switchable Spare Columns with Disabling (SSC-Disable)

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758652 ◽

2019 ◽

Author(s):

Soowang Park ◽

Sandeep K. Gupta

Keyword(s):

Cache Design ◽

Design For Yield

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PCB Hardware Trojans: Attack Modes and Detection Strategies

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758643 ◽

2019 ◽

Author(s):

Matthew McGuire ◽

Umit Ogras ◽

Sule Ozev

Keyword(s):

Hardware Trojans ◽

Detection Strategies

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Wafer Pattern Recognition Using Tucker Decomposition

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758667 ◽

2019 ◽

Author(s):

Ahmed Wahba ◽

Li-C. Wang ◽

Zheng Zhang ◽

Nik Sumikawa

Keyword(s):

Pattern Recognition ◽

Tucker Decomposition

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Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758628 ◽

2019 ◽

Author(s):

Tai Song ◽

Huaguo Liang ◽

Ying Sun ◽

Zhengfeng Huang ◽

Maoxiang Yi ◽

...

Keyword(s):

Deep Learning ◽

Short Term Memory ◽

Adaptive Testing ◽

Term Memory ◽

Long Short Term Memory

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Quality Obfuscation for Error-Tolerant and Adaptive Hardware IP Protection

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758637 ◽

2019 ◽

Author(s):

Abdulrahman Alaql ◽

Tamzidul Hoque ◽

Domenic Forte ◽

Swarup Bhunia

Keyword(s):

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Special Session: A Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758640 ◽

2019 ◽

Author(s):

Malav Shah ◽

Subhadeep Ghosh ◽

Scott Martin

Keyword(s):

Special Session ◽

Industrial Markets ◽

Quality And Reliability

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Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758636 ◽

2019 ◽

Author(s):

Pavan Kumar Datla Jagannadha ◽

Mahmut Yilmaz ◽

Milind Sonawane ◽

Sailendra Chadalavada ◽

Shantanu Sarangi ◽

...

Keyword(s):

Special Session

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