Analysis Of Nonlinear Optical Phenomena: Perspective Of in situ Monitoring Method Of The Semiconductor-Film Crystal-Structure

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1990 ◽  
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Vasily I. Proc' ◽  
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2014 ◽  
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1999 ◽  
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Nano Letters ◽  
2010 ◽  
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Mikhail A. Kats ◽  
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