A simple solution to Lamport's concurrent programming problem with linear wait

Author(s):  
B. K. Szymanski
Author(s):  
J. J. Kelsch ◽  
A. Holtz

A simple solution to the serious problem of specimen contamination in the electron microscope is presented. This is accomplished by the introduction of clean helium into the vacuum exactly at the specimen position. The local pressure gradient thus established inhibits the migration of hydrocarbon molecules to the specimen surface. The high ionization potential of He permits the use of relatively large volumes of the gas, without interfering with gun stability. The contamination rate is reduced on metal samples by a factor of 10.


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