ScienceGate
Advanced Search
Author Search
Journal Finder
Blog

Sign in / Sign up

ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up

- Reliability and Degradation of Strain-Engineered MOSFETs

Strain-Engineered MOSFETs ◽

10.1201/9781315216577-13 ◽

2018 ◽

pp. 250-269

Download Full-text

Services

Search Engine
Journal Finder
Author Search
Bibliometric Visualization

Support

FAQs
For Editors
For Authors
Advertise With Us

Links

About Us
Contact Us
Terms and Conditions
Privacy Policy

[email protected]

The ScienceGate team tries to make research easier by managing and providing several unique services gathered in a web platform

©2024 ScienceGate All rights reserved.

Sign in / Sign up

Export Citation Format

Share Document