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Strain-Engineered MOSFETs
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11
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Published By CRC Press
9781315216577
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- Process-Induced Stress Engineering in CMOS Technology
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-8
◽
2018
◽
pp. 74-107
Keyword(s):
Cmos Technology
◽
Induced Stress
◽
Stress Engineering
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- Introduction
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-6
◽
2018
◽
pp. 22-35
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- Technology CAD of Strain-Engineered MOSFETs
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-12
◽
2018
◽
pp. 226-249
Keyword(s):
Technology Cad
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- Reliability and Degradation of Strain-Engineered MOSFETs
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-13
◽
2018
◽
pp. 250-269
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- Process Compact Modelling of Strain-Engineered MOSFETs
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-14
◽
2018
◽
pp. 270-293
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- Electronic Properties of Strain-Engineered Semiconductors
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-9
◽
2018
◽
pp. 108-135
Keyword(s):
Electronic Properties
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- Strain-Engineered MOSFETs
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-10
◽
2018
◽
pp. 136-163
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- Process-Aware Design of Strain-Engineered MOSFETs
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-15
◽
2018
◽
pp. 294-307
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- Noise in Strain-Engineered Devices
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-11
◽
2018
◽
pp. 164-225
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- Conclusions
Strain-Engineered MOSFETs
◽
10.1201/9781315216577-16
◽
2018
◽
pp. 308-309
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