scholarly journals Measurement of optical to electrical and electrical to optical delays with ps-level uncertainty

2018 ◽  
Vol 26 (11) ◽  
pp. 14650
Author(s):  
H. Z. Peek ◽  
T. J. Pinkert ◽  
P. P. M. Jansweijer ◽  
J. C. J. Koelemeij
Keyword(s):  
2010 ◽  
Vol 35 (18) ◽  
pp. 3042 ◽  
Author(s):  
Xiaoxia Wu ◽  
Jian Wang ◽  
Omer F. Yilmaz ◽  
Scott R. Nuccio ◽  
Antonella Bogoni ◽  
...  

2006 ◽  
Vol 14 (25) ◽  
pp. 12022 ◽  
Author(s):  
Yoshitomo Okawachi ◽  
Jay E. Sharping ◽  
Chris Xu ◽  
Alexander L. Gaeta

2008 ◽  
Vol 33 (13) ◽  
pp. 1518 ◽  
Author(s):  
Xiaoxia Wu ◽  
Louis Christen ◽  
Omer F. Yilmaz ◽  
Scott R. Nuccio ◽  
Alan E. Willner

Author(s):  
N. Tessema ◽  
Z. Cao ◽  
J. H.C van Zantvoort ◽  
A. Dubok ◽  
E. Tangdiongga ◽  
...  

2005 ◽  
Vol 94 (15) ◽  
Author(s):  
Yoshitomo Okawachi ◽  
Matthew S. Bigelow ◽  
Jay E. Sharping ◽  
Zhaoming Zhu ◽  
Aaron Schweinsberg ◽  
...  

1975 ◽  
Vol 27 (4) ◽  
pp. 237-239 ◽  
Author(s):  
B. Crosignani ◽  
B. Daino ◽  
P. Di Porto

2010 ◽  
Vol 35 (4) ◽  
pp. 523 ◽  
Author(s):  
S. R. Nuccio ◽  
O. F. Yilmaz ◽  
X. Wu ◽  
A. E. Willner

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