Measurement of optical to electrical and electrical to optical delays with ps-level uncertainty
2018 ◽
Vol 26
(11)
◽
pp. 14650
H. Z. Peek
◽
T. J. Pinkert
◽
P. P. M. Jansweijer
◽
J. C. J. Koelemeij
2010 ◽
Vol 35
(18)
◽
pp. 3042
◽
Xiaoxia Wu
◽
Jian Wang
◽
Omer F. Yilmaz
◽
Scott R. Nuccio
◽
Antonella Bogoni
◽
...
2006 ◽
Vol 14
(25)
◽
pp. 12022
◽
Yoshitomo Okawachi
◽
Jay E. Sharping
◽
Chris Xu
◽
Alexander L. Gaeta
2008 ◽
Vol 33
(13)
◽
pp. 1518
◽
Xiaoxia Wu
◽
Louis Christen
◽
Omer F. Yilmaz
◽
Scott R. Nuccio
◽
Alan E. Willner
S. R. Nuccio
◽
O. F. Yilmaz
◽
X. Wu
◽
A. E. Willner
N. Tessema
◽
Z. Cao
◽
J. H.C van Zantvoort
◽
A. Dubok
◽
E. Tangdiongga
◽
...
Yoshitomo Okawachi
◽
Matthew S. Bigelow
◽
Jay E. Sharping
◽
Zhaoming Zhu
◽
Aaron Schweinsberg
◽
...
1975 ◽
Vol 27
(4)
◽
pp. 237-239
◽
B. Crosignani
◽
B. Daino
◽
P. Di Porto
2010 ◽
Vol 35
(4)
◽
pp. 523
◽
S. R. Nuccio
◽
O. F. Yilmaz
◽
X. Wu
◽
A. E. Willner
M.C. Parker
◽
D.K. Hunter
◽
S.D. Walker