Analysis of screening effects in multiple-gate and gate-all-around Si NW array FETs

2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.23919/sispad.2017.8085294 ◽

2017 ◽

Author(s):

Ghader Darbandy ◽

Sven Mothes ◽

Michael SchrOter ◽

Martin Claus

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