2017 International Test Conference in Asia (ITC-Asia)
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Published By IEEE

9781538630518

Author(s):  
Po-Hao Chen ◽  
Chi-Lin Lee ◽  
Jing-Yu Chen ◽  
Po-Wei Chen ◽  
James Chien-Mo Li

Author(s):  
Cheng-Wen Wu ◽  
Bing-Yang Lin ◽  
Hsin-Wei Hung ◽  
Shu-Mei Tseng ◽  
Chi Chen

Author(s):  
Michael A. Kochte ◽  
Rafal Baranowski ◽  
Hans-Joachim Wunderlich
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