Secondary Ion Mass Spectroscopy of Solid Surfaces
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Published By CRC Press

9780429070327

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Physics of secondary ion emission

Secondary Ion Mass Spectroscopy of Solid Surfaces ◽

10.1201/9780429070327-1 ◽

2020 ◽

pp. 1-34

Author(s):

V. Cherepin

Keyword(s):

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

In-depth analysis

Secondary Ion Mass Spectroscopy of Solid Surfaces ◽

10.1201/9780429070327-4 ◽

2020 ◽

pp. 91-116

Author(s):

V. Cherepin

Keyword(s):

Depth Analysis

Study of processes at the surface

Secondary Ion Mass Spectroscopy of Solid Surfaces ◽

10.1201/9780429070327-5 ◽

2020 ◽

pp. 117-138

Author(s):

V. Cherepin

Constitutional analysis of solids by SIMS

Secondary Ion Mass Spectroscopy of Solid Surfaces ◽

10.1201/9780429070327-3 ◽

2020 ◽

pp. 65-90

Author(s):

V. Cherepin

Keyword(s):

Constitutional Analysis

SIMS Instrumentation

Secondary Ion Mass Spectroscopy of Solid Surfaces ◽

10.1201/9780429070327-2 ◽

2020 ◽

pp. 35-64

Author(s):

V. Cherepin