[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium
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The evolution of employee empowerment

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197633 ◽

2003 ◽

Author(s):

L.S. Behnke ◽

R.M. Hamlin ◽

B.C. Smoak

Keyword(s):

Employee Empowerment

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Semiconductor manufacturing at a crossroads: the partnership imperative

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197625 ◽

2003 ◽

Author(s):

J.C. Morgan

Keyword(s):

Semiconductor Manufacturing

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Bulletproofing new product fab implementation

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197648 ◽

2003 ◽

Author(s):

D. Allred

Keyword(s):

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Paperless manufacturing for IC assembly

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197643 ◽

2003 ◽

Author(s):

S.N. Ram ◽

S.-P.T. Wang

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Vendor/customer alliance for furnace upgrade

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197647 ◽

2003 ◽

Author(s):

C. Bayne ◽

C. Guiver ◽

J. Bhakta ◽

R. Hartshorn ◽

J. Schuler

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Establishing teams in a 24-hour seven-day work week environment

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197636 ◽

2003 ◽

Author(s):

W. Hughes

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Productivity enhancement

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197638 ◽

2003 ◽

Author(s):

D. Rose

Keyword(s):

Productivity Enhancement

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Bibliography of books and articles related to manufacturing: 1992

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197652 ◽

2003 ◽

Author(s):

G. Cheeck

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Estimating semiconductor yield from equipment particle measurements

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197629 ◽

2003 ◽

Author(s):

D. Dance ◽

K. Gildersleeve

Keyword(s):

Particle Measurements

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From trendcharts to control charts: setup tests for making the leap

[1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium ◽

10.1109/ismss.1992.197626 ◽

2003 ◽

Author(s):

R. Abugov

Keyword(s):

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