2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET)
Latest Publications


TOTAL DOCUMENTS

18
(FIVE YEARS 0)

H-INDEX

4
(FIVE YEARS 0)

Published By IEEE

9781538604243

Author(s):  
Laura L. Pullum ◽  
Dave Towey ◽  
Upulee Kanewala ◽  
Chang-Ai Sun ◽  
Marcio Eduardo Delamaro

Sign in / Sign up

Export Citation Format

Share Document