2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET)
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9781538604243

Author(s):  
Sergio Segura ◽  
Amador Duran ◽  
Javier Troya ◽  
Antonio Ruiz Cortes

Author(s):  
Mikael Lindvall ◽  
Adam Porter ◽  
Gudjon Magnusson ◽  
Christoph Schulze

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