Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Published By Springer International Publishing

9783030683672, 9783030683689

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Process Variability Mitigation

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_6 ◽

2021 ◽

pp. 81-105

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Keyword(s):

Process Variability

Circuit-Level Mitigation Approaches

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_4 ◽

2021 ◽

pp. 65-71

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Soft Error Mitigation

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_7 ◽

2021 ◽

pp. 107-114

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Keyword(s):

Soft Error ◽

Error Mitigation ◽

Soft Error Mitigation

Reliability Challenges in FinFETs

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_3 ◽

2021 ◽

pp. 29-63

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Introduction

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_1 ◽

2021 ◽

pp. 1-6

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Final Remarks

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_9 ◽

2021 ◽

pp. 125-127

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Evaluation Methodology

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_5 ◽

2021 ◽

pp. 73-79

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Keyword(s):

Evaluation Methodology

FinFET Technology

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_2 ◽

2021 ◽

pp. 7-27

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

General Trade-Offs

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ◽

10.1007/978-3-030-68368-9_8 ◽

2021 ◽

pp. 115-124

Author(s):

Alexandra Zimpeck ◽

Cristina Meinhardt ◽

Laurent Artola ◽

Ricardo Reis

Keyword(s):

Trade Offs

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Process Variability Mitigation

Circuit-Level Mitigation Approaches

Soft Error Mitigation

Reliability Challenges in FinFETs

Introduction

Final Remarks

Evaluation Methodology

FinFET Technology

General Trade-Offs

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Latest Publications