IEEE Transactions on Device and Materials Reliability
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Published By Institute Of Electrical And Electronics Engineers

1558-2574, 1530-4388

Author(s):  
Xiaole Cui ◽  
Qixue Zhang ◽  
Xiaoxin Cui
Keyword(s):  
Low Cost ◽  

Author(s):  
Pratik Nimbalkar ◽  
Christopher Blancher ◽  
Mohanalingam Kathaperumal ◽  
Madhavan Swaminathan ◽  
Rao Tummala

2021 ◽  
Vol 21 (4) ◽  
pp. 454-454
Author(s):  
Edmundo A. Gutierrez-D.

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