Unlocking the Allometric Growth and Dissolution of Zn Anodes at Initial Nucleation and an Early Stage with Atomic Force Microscopy

2021 ◽  
Author(s):  
Xunzhu Zhou ◽  
Qiu Zhang ◽  
Zhimeng Hao ◽  
Yilin Ma ◽  
Oleg A. Drozhzhin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Early Stage ◽  
Allometric Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Initial Nucleation

An Atomic Force Microscopy Study of the Initial Nucleation of GaN on Sapphire

1995 ◽  
Vol 395 ◽  
Author(s):  
M. Richards-Babb ◽  
S. L. Buczkowski ◽  
Zhonghai Yu ◽  
T. H. Myers
Keyword(s):  
Atomic Force Microscopy ◽  
Plasma Source ◽  
Microscopy Study ◽  
Rf Plasma ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Initial Nucleation ◽  
Dimensional Growth ◽  
Thick Layers

ABSTRACTPreliminary results of a study of GaN nucleation and growth by molecular beam epitaxy using a nitrogen rf plasma source are presented. Nucleation layers and 3000 Å thick layers were investigated by atomic force microscopy and x-ray diffraction. Growth under gallium-rich conditions both increased nucleation island size and promoted two-dimensional growth.

Surface Evolution of Copolymer thin Films as Revealed by Atomic Force Microscopy

1991 ◽  
Vol 248 ◽  
Author(s):  
G. Coulon ◽  
B. Collin ◽  
D. Chatenay ◽  
D. Ausserre
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Free Surface ◽  
Film Thickness ◽  
Early Stage ◽  
Film Surface ◽  
Spatial Correlations ◽  
Surface Evolution ◽  
Force Microscopy ◽  
Atomic Force

AbstractAtomic Force Microscopy has been used to study the early stage evolution of the free surface of annealed symmetric poly(styrene-b-n-butylmethacrylate) diblock copolymer thin films. As the lamellar ordering propagates through the film thickness, Islands or holes are formed on the free surface. It Is shown that, depending on the Initial film thickness, I.e. on the fraction of the film surface occupied by the islands (or holes) In the ordered state, the existence or non-existence of spatial correlations characterizes the ordering kinetics of both islands and holes. However, the limit between these two regimes is not the same in the two cases : in the case of holes, spatial correlations occur for a higher value of the surface coverage than In the case of islands.

229 Evaluation of Fatigue Damage of Early Stage on Stainless Steel by EBSD Method and Atomic Force Microscopy

2006 ◽  
Vol 2006 (0) ◽  
pp. 115-116
Author(s):  
Tomoya YAMAMOTO ◽  
Keisuke TANAKA ◽  
Yoshiak AKINIWA ◽  
Hidehiko KIMURA ◽  
Yun WANG
Keyword(s):  
Atomic Force Microscopy ◽  
Stainless Steel ◽  
Fatigue Damage ◽  
Early Stage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ebsd Method

Thermal Induced Instability of Thin Polymer Films: A Study by Atomic Force Microscopy

2001 ◽  
Vol 13 (4) ◽  
pp. 259-267 ◽  
Author(s):  
Daoji Gan ◽  
Wenjing Cao ◽  
Ng E Puat
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Lower Layer ◽  
Early Stage ◽  
Contact Angles ◽  
Random Copolymers ◽  
Chemical Compositions ◽  
Force Microscopy ◽  
Molecular Weights ◽  
Atomic Force

Systematic studies of thin-film stabilities of random copolymers consisting of decyl methacrylate (DMA)/methyl methacrylate (MMA) units on a polystyrene (PS) layer tethered to silicon wafer have been carried out by atomic force microscopy (AFM) as functions of molecular weight and chemical composition. Upon annealing at an elevated temperature above the glass transition temperature ( Tg), the initially flat polymer films break up into small holes, and finally form macroscopic droplets. The tethered PS layer was found to be dense enough to inhibit penetration of the copolymers into the lower layer during the annealing process. AFM studies at an early stage showed that the velocity of the hole growth was dependent upon both the molecular weights and chemical compositions of the copolymers. However, the equilibrium contact angles of the copolymer droplets formed on the PS layer were more dependent on the chemical compositions than on the molecular weights.

scholarly journals Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials

Materials ◽  
2020 ◽  
Vol 13 (3) ◽  
pp. 668 ◽  
Author(s):  
Hanbing Chen ◽  
Zhenbo Qin ◽  
Meifeng He ◽  
Yichun Liu ◽  
Zhong Wu
Keyword(s):  
Atomic Force Microscopy ◽  
Early Stage ◽  
Sample Surface ◽  
Electrolytic Cell ◽  
Research Progress ◽  
Force Microscopy ◽  
Research Areas ◽  
Atomic Force ◽  
Wide Range ◽  
Corrosion Science

Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.

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