Characterization of Solution-Annealed and Thermally-Treated Alloy 600 Intergranular Oxidation using Advanced Analytical Electron Microscopy

Author(s):  
giacomo bertali ◽  
Fabio Scenini ◽  
Grace Burke
2003 ◽  
Vol 9 (S02) ◽  
pp. 206-207
Author(s):  
Shu-You Li ◽  
Ying Guo ◽  
M. Aslam ◽  
Lei Fu ◽  
Vinayak P. Dravid

1993 ◽  
Vol 16 (6) ◽  
pp. 317-321 ◽  
Author(s):  
J.Y. Dai ◽  
D.X. Li ◽  
H.Q. Ye ◽  
G.J. Zhang ◽  
Z.Z. Jin

1995 ◽  
Author(s):  
R.G. Behrens ◽  
E.C. Buck ◽  
N.L. Dietz ◽  
J.K. Bates ◽  
E. Van Deventer ◽  
...  

Author(s):  
G. Wirmark ◽  
G. Wahlberg ◽  
H. Nordén

X-ray microanalysis with windowless or ultra-thin window Si(Li)-detectors is becoming increasingly important in analytical electron microscopy. The most common approach in the quantification of this method is the thin film ratio method.where CA and CB denote the concentrations of elements A and B respectively and IA and IB are the corresponding x-ray intensities. The KAB-factor should ideally be determined from analyses of standard specimens of known compositions.


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