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electron microscopy
Recently Published Documents
TOTAL DOCUMENTS
67943
(FIVE YEARS 6938)
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243
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Latest Documents
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Collective phenomena on metallic surfaces studied with scanning tunneling microscopy and low energy electron microscopy
10.3990/1.9789036553285
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2022
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Author(s):
Martina Tsvetanova
Keyword(s):
Electron Microscopy
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Scanning Tunneling Microscopy
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Low Energy
◽
Energy Electron
◽
Scanning Tunneling
◽
Collective Phenomena
◽
Metallic Surfaces
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Tunneling Microscopy
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Low Energy Electron
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Characterization of a coating for radioprotection, by X-ray diffraction, scanning electron microscopy, and dispersive energy spectroscopy
Construction and Building Materials
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10.1016/j.conbuildmat.2022.126326
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2022
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Vol 321
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pp. 126326
Author(s):
Gladis Aparecida Galindo Reisemberger de Souza
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Ramón Sigifredo Cortés Paredes
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Frieda Saicla Barros
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Gustavo Bavaresco Sucharski
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Sebastião Ribeiro Junior
◽
...
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
X Ray Diffraction
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X Ray
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Scanning Electron
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Characterization of atmospheric aerosols in the Antarctic region using Raman Spectroscopy and Scanning Electron Microscopy
Spectrochimica Acta Part A Molecular and Biomolecular Spectroscopy
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10.1016/j.saa.2021.120452
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2022
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Vol 266
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pp. 120452
Author(s):
César Marina-Montes
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Luis V. Pérez-Arribas
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Jesús Anzano
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Silvia Fdez-Ortiz de Vallejuelo
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Julene Aramendia
◽
...
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
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Raman Spectroscopy
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Atmospheric Aerosols
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Antarctic Region
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The Antarctic
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Scanning Electron
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Investigation of a dual-hole structure-based broadband femtosecond nondiffracting SPP beam emitter by photoemission electron microscopy
Optics & Laser Technology
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10.1016/j.optlastec.2021.107538
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2022
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Vol 146
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pp. 107538
Author(s):
Hanmin Hu
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Yulu Qin
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Peng Lang
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Xiaowei Song
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Boyu Ji
◽
...
Keyword(s):
Electron Microscopy
◽
Photoemission Electron Microscopy
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Hole Structure
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Photoemission Electron
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Ultra-small cobalt particles embedded in titania by ion beam synthesis: Additional datasets including electron microscopy, neutron reflectometry, modelling outputs and particle size analysis
Data in Brief
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10.1016/j.dib.2021.107674
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2022
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Vol 40
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pp. 107674
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Cited By ~ 1
Author(s):
Abdulhakim Bake
◽
Md Rezoanur Rahman
◽
Peter J. Evans
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Michael Cortie
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Mitchell Nancarrow
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...
Keyword(s):
Electron Microscopy
◽
Particle Size
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Ion Beam
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Particle Size Analysis
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Neutron Reflectometry
◽
Size Analysis
◽
Ion Beam Synthesis
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Towards a generic protocol for measuring the constituent particle size distribution of E171 in food by electron microscopy
Food Control
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10.1016/j.foodcont.2021.108492
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2022
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Vol 132
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pp. 108492
Author(s):
Eveline Verleysen
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Frédéric Brassinne
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Frederic Van Steen
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Nadia Waegeneers
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Karlien Cheyns
◽
...
Keyword(s):
Electron Microscopy
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Particle Size
◽
Particle Size Distribution
◽
Size Distribution
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Constituent Particle
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Scanning electron microscopy for differentiating charred endocarps of Rhus/Toxicodendron species and tracking the use of the lacquer tree and Asian poison ivy in Japanese prehistory
Journal of Archaeological Science Reports
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10.1016/j.jasrep.2021.103335
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2022
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Vol 41
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pp. 103335
Author(s):
Christian Leipe
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Antonella Aquaro
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Pavel E. Tarasov
Keyword(s):
Electron Microscopy
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Scanning Electron Microscopy
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Poison Ivy
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Scanning Electron
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Scanning and transmission electron microscopy analysis for surface-modified AM60 magnesium alloy by pulsed electron beam irradiation
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
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10.1016/j.nimb.2021.12.014
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2022
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Vol 513
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pp. 9-13
Author(s):
M. Azadi
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K. Ivanov
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S. Rezanezhad
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S.A. Ashraf Talesh
Keyword(s):
Electron Microscopy
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Transmission Electron Microscopy
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Electron Beam Irradiation
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Beam Irradiation
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Transmission Electron Microscopy Analysis
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Pulsed Electron Beam
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Transmission Electron
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Electron Microscopy Analysis
◽
Microscopy Analysis
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Surface Modified
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Direct visualization of highly resistive areas in GaN by means of low-voltage scanning electron microscopy
Materials Science in Semiconductor Processing
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10.1016/j.mssp.2021.106293
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2022
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Vol 138
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pp. 106293
Author(s):
Iwona Jóźwik
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Jacek Jagielski
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Piotr Caban
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Maciej Kamiński
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Ulrich Kentsch
Keyword(s):
Electron Microscopy
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Scanning Electron Microscopy
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Low Voltage
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Direct Visualization
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Voltage Scanning
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Scanning Electron
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Design of a graphical user interface for few-shot machine learning classification of electron microscopy data
Computational Materials Science
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10.1016/j.commatsci.2021.111121
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2022
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Vol 203
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pp. 111121
Author(s):
Christina Doty
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Shaun Gallagher
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Wenqi Cui
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Wenya Chen
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Shweta Bhushan
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...
Keyword(s):
Electron Microscopy
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Machine Learning
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User Interface
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Graphical User Interface
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Machine Learning Classification
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Electron Microscopy Data
◽
Microscopy Data
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