Strain and particle size analysis in ion beam synthesized SiC nanoparticles using Raman scattering studies

2017 ◽  
Vol 52 (5) ◽  
pp. 1600391 ◽  
Author(s):  
K. Saravanan ◽  
G. Jayalakshmi ◽  
B. K. Panigrahi ◽  
René Hübner
Keyword(s):  
Particle Size ◽  
Raman Scattering ◽  
Ion Beam ◽  
Particle Size Analysis ◽  
Size Analysis ◽  
Sic Nanoparticles

Spatially offset Raman scattering line-mapping as a potential tool for particle size analysis

The Analyst ◽  
2021 ◽  
Author(s):  
Sang Hoon Cho ◽  
Si Won Song ◽  
Hyung Min Kim ◽  
Hoeil Chung
Keyword(s):  
Particle Size ◽  
Raman Spectroscopy ◽  
Raman Scattering ◽  
Particle Size Analysis ◽  
Size Analysis ◽  
Photon Migration ◽  
Mapping Scheme ◽  
Potential Tool

A spatially offset Raman spectroscopy (SORS) line-mapping scheme was explored as a tool for measurement of particle size. The proposed scheme is based on the fact that photon migration in...

APSAS; an Automated Particle Size Analysis System

Circular ◽  
1985 ◽  
Author(s):  
Lawrence J. Poppe ◽  
A.H. Eliason ◽  
J.J. Fredericks
Keyword(s):  
Particle Size ◽  
Particle Size Analysis ◽  
Size Analysis ◽  
Analysis System
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