12.2: Narrow Angle Scattering Measurement of PDLC/PNLC Smart Window

Monte Carlo (MC) methods, based on random updates and the trial-and-error principle, are well suited to retrieve form-free particle size distributions from small-angle scattering patterns of non-interacting low-concentration scatterers such as particles in solution or precipitates in metals. Improvements are presented to existing MC methods, such as a non-ambiguous convergence criterion, nonlinear scaling of contributions to match their observability in a scattering measurement, and a method for estimating the minimum visibility threshold and uncertainties on the resulting size distributions.

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X-ray small angle scattering measurement of clustering in CuNi

Physics Letters A ◽

10.1016/0375-9601(68)90139-4 ◽

1968 ◽

Vol 26 (12) ◽

pp. 593-594 ◽

Cited By ~ 10

Author(s):

A. Kidron

Keyword(s):

Small Angle ◽

Small Angle Scattering ◽

X Ray ◽

Angle Scattering ◽

Scattering Measurement

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Small-angle scattering measurement

10.1117/12.49642 ◽

1991 ◽

Author(s):

Zu-Han Gu ◽

Richard S. Dummer

Keyword(s):

Small Angle ◽

Small Angle Scattering ◽

Angle Scattering ◽

Scattering Measurement

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Achieving grazing-incidence ultra-small-angle X-ray scattering in a laboratory setup

Journal of Applied Crystallography ◽

10.1107/s1600576715001752 ◽

2015 ◽

Vol 48 (2) ◽

pp. 608-612 ◽

Cited By ~ 2

Author(s):

Nan Zheng ◽

Zhiyong Yi ◽

Zhenzhen Li ◽

Ran Chen ◽

Yuqing Lai ◽

...

Keyword(s):

Small Angle ◽

Grazing Incidence ◽

Polystyrene Latex ◽

Proper Position ◽

Laboratory Setup ◽

X Ray Scattering ◽

Detector Distance ◽

Angle Scattering ◽

Vector Magnitude ◽

Scattering Measurement

A grazing-incidence sample stage was designed for realizing grazing-incidence scattering measurements, especially in the ultra-small-angle regime, in a modified Xenocs Xeuss system in the laboratory. The designed sample stage, which is composed of four separate motorized positioning stages, allows the sample to be moved along four different directions to locate it in the proper position for scattering measurement. In an effort to realize grazing-incidence ultra-small-angle scattering (GIUSAXS) measurements, both the separation of the collimation slit systems and the sample-to-detector distance have been lengthened. At a separation of the collimation slit systems of 2400 mm and a sample-to-detector distance of 6558 mm, the effective smallest scattering vector magnitudeqminreaches 0.01 nm−1. A colloidal crystalline thin film obtained from drying a polystyrene latex dispersion on silicon substrate was measured in the setup in GIUSAXS mode at different beam sizes. The resultant GIUSAXS patterns at smaller beam sizes reveal fine crystalline structures in the film.

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Small Angle Electron Scattering From Vacuum Condensed Metallic Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101657 ◽

1968 ◽

Vol 26 ◽

pp. 380-381

Author(s):

J. Silcox ◽

R. H. Wade

Keyword(s):

Electron Scattering ◽

Small Angle ◽

Ring Structure ◽

Two Dimensional ◽

Metallic Films ◽

Micro Structure ◽

Angle Scattering ◽

The Fourier Transform ◽

Source Of Information ◽

Kinematical Theory

Recent work has drawn attention to the possibilities that small angle electron scattering offers as a source of information about the micro-structure of vacuum condensed films. In particular, this serves as a good detector of discontinuities within the films. A review of a kinematical theory describing the small angle scattering from a thin film composed of discrete particles packed close together will be presented. Such a model could be represented by a set of cylinders packed side by side in a two dimensional fluid-like array, the axis of the cylinders being normal to the film and the length of the cylinders becoming the thickness of the film. The Fourier transform of such an array can be regarded as a ring structure around the central beam in the plane of the film with the usual thickness transform in a direction normal to the film. The intensity profile across the ring structure is related to the radial distribution function of the spacing between cylinders.

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High-angle electron scattering from amorphous silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100137185 ◽

1995 ◽

Vol 53 ◽

pp. 162-163

Author(s):

M. Libera ◽

J.A. Ott ◽

K. Siangchaew ◽

L. Tsung

Keyword(s):

Electron Scattering ◽

Amorphous Material ◽

Structural Defects ◽

Constant Thickness ◽

High Angle ◽

Fast Electrons ◽

Angle Scattering ◽

Stem Image ◽

Amorphous Si ◽

Thermal Vibrations

Channeling occurs when fast electrons follow atomic strings in a crystal where there is a minimum in the potential energy (1). Channeling has a strong effect on high-angle scattering. Deviations in atomic position along a channel due to structural defects or thermal vibrations increase the probability of scattering (2-5). Since there are no extended channels in an amorphous material the question arises: for a given material with constant thickness, will the high-angle scattering be higher from a crystal or a glass?Figure la shows a HAADF STEM image collected using a Philips CM20 FEG TEM/STEM with inner and outer collection angles of 35mrad and lOOmrad. The specimen (6) was a cross section of singlecrystal Si containing: amorphous Si (region A), defective Si containing many stacking faults (B), two coherent Ge layers (CI; C2), and a contamination layer (D). CBED patterns (fig. lb), PEELS spectra, and HAADF signals (fig. lc) were collected at 106K and 300K along the indicated line.

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