Comparison of wavelength-dispersive X-ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method

2018 ◽  
Vol 47 (4) ◽  
pp. 287-293
Author(s):  
Pierre Masson ◽  
Thierry Dalix ◽  
Guillaume Daugey ◽  
Patrice Soulé
Sign in / Sign up

Export Citation Format

Share Document