Optimal “Anti-Bayesian” Parametric Pattern Classification for the Exponential Family Using Order Statistics Criteria

Lecture Notes in Computer Science - Image Analysis and Recognition ◽

10.1007/978-3-642-31295-3_2 ◽

2012 ◽

pp. 11-18 ◽

Author(s):

A. Thomas ◽

B. John Oommen

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Exponential Family

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“Anti-Bayesian” parametric pattern classification using order statistics criteria for some members of the exponential family

Pattern Recognition ◽

10.1016/j.patcog.2013.02.006 ◽

2014 ◽

Vol 47 (1) ◽

pp. 40-55 ◽

Author(s):

B. John Oommen ◽

A. Thomas

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Exponential Family

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Optimal “Anti-Bayesian” Parametric Pattern Classification Using Order Statistics Criteria

Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - Lecture Notes in Computer Science ◽

10.1007/978-3-642-33275-3_1 ◽

2012 ◽

pp. 1-13 ◽

Author(s):

A. Thomas ◽

B. John Oommen

Keyword(s):

Order Statistics ◽

Pattern Classification

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Generalized order statistics: an exponential family in model parameters

10.1080/02331888.2010.498046 ◽

2012 ◽

Vol 46 (2) ◽

pp. 159-166 ◽

Author(s):

Stefan Bedbur ◽

Eric Beutner ◽

Udo Kamps

Keyword(s):

Order Statistics ◽

Exponential Family ◽

Generalized Order Statistics ◽

Model Parameters ◽

Generalized Order

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Pattern classification using novel order statistics and border identification methods

10.22215/etd/2013-08573 ◽

2013 ◽

Author(s):

Anu Thomas

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Identification Methods

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Characterizations via conditional distributions

Journal of Applied Probability ◽

10.1017/s0021900200105339 ◽

1977 ◽

Vol 14 (04) ◽

pp. 806-816

Author(s):

Robert H. Berk

Keyword(s):

Order Statistics ◽

Conditional Distribution ◽

Joint Distribution ◽

Exponential Family ◽

Random Variables ◽

Independent Random Variables ◽

Conditional Distributions

For independent random variablesXandY,if the conditional distribution ofXgivenX+Ysatisfies certain conditions, then the joint distribution ofXandYis a member of a certain one-parameter exponential family. Extensions fornindependent random variables are given. A characterization for independent random variables involving order statistics is also given.

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A note on order statistics-based parametric pattern classification

Pattern Recognition ◽

10.1016/j.patcog.2014.07.021 ◽

2015 ◽

Vol 48 (1) ◽

pp. 43-49 ◽

Author(s):

Lixia Hu

Keyword(s):

Order Statistics ◽

Pattern Classification

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Linear and Order Statistics Combiners for Pattern Classification

Perspectives in Neural Computing - Combining Artificial Neural Nets ◽

10.1007/978-1-4471-0793-4_6 ◽

1999 ◽

pp. 127-161 ◽

Author(s):

Amanda J. C. Sharkey

Keyword(s):

Order Statistics ◽

Pattern Classification

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The fundamental theory of optimal “Anti-Bayesian” parametric pattern classification using order statistics criteria

Pattern Recognition ◽

10.1016/j.patcog.2012.07.004 ◽

2013 ◽

Vol 46 (1) ◽

pp. 376-388 ◽

Author(s):

A. Thomas ◽

B. John Oommen

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Fundamental Theory

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High-Order Statistics of Micro-Texton for HEp-2 Staining Pattern Classification

Intelligent Systems Reference Library - Artificial Intelligence in Decision Support Systems for Diagnosis in Medical Imaging ◽

10.1007/978-3-319-68843-5_6 ◽

2018 ◽

pp. 135-164

Author(s):

Xian-Hua Han ◽

Yen-Wei Chen

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Staining Pattern ◽

High Order Statistics

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High-Order Statistics of Microtexton for HEp-2 Staining Pattern Classification

IEEE Transactions on Biomedical Engineering ◽

10.1109/tbme.2014.2320294 ◽

2014 ◽

Vol 61 (8) ◽

pp. 2223-2234 ◽

Author(s):

Xian-Hua Han ◽

Jian Wang ◽

Gang Xu ◽

Yen-Wei Chen

Keyword(s):

Order Statistics ◽

Pattern Classification ◽

Staining Pattern ◽

High Order Statistics

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