Integration of Testing Effort Function into Delayed S-Shaped Software Reliability Growth Model with Imperfect Debugging — a Proposed Bokhari Model

Imperfect Debugging ◽

Testing Effort ◽

Parameter optimization of software reliability growth model with S-shaped testing-effort function using improved swarm intelligent optimization

Applied Soft Computing ◽

10.1016/j.asoc.2015.11.041 ◽

2016 ◽

Vol 40 ◽

pp. 283-291 ◽

Cited By ~ 16

Author(s):

Cong Jin ◽

Shu-Wei Jin

Keyword(s):

Growth Model ◽

Parameter Optimization ◽

Software Reliability ◽

Reliability Growth ◽

Intelligent Optimization ◽

Testing Effort ◽

2016 International Conference on Research Advances in Integrated Navigation Systems (RAINS) ◽

A hybrid method for parameter estimation of software reliability growth model using Modified Genetic Swarm Optimization with the aid of logistic exponential testing effort function

10.1109/rains.2016.7764400 ◽

2016 ◽

Cited By ~ 4

Author(s):

K Mallikharjuna Rao ◽

K. Anuradha

Keyword(s):

Parameter Estimation ◽

Growth Model ◽

Hybrid Method ◽

Software Reliability ◽

Reliability Growth ◽

Swarm Optimization ◽

Testing Effort ◽

Proceedings The Eighth International Symposium on Software Reliability Engineering ISSRE-97 ◽

Analysis of a software reliability growth model with logistic testing-effort function

10.1109/issre.1997.630886 ◽

2002 ◽

Cited By ~ 30

Author(s):

Chin-Yu Huang ◽

Sy-Yen Kuo ◽

Ing-Yi Chen

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Testing Effort ◽

Multi up-gradation software reliability growth model with imperfect debugging

International Journal of Systems Assurance Engineering and Management ◽

10.1007/s13198-011-0031-3 ◽

2010 ◽

Vol 1 (4) ◽

pp. 299-306 ◽

Cited By ~ 33

Author(s):

P. K. Kapur ◽

Ompal Singh ◽

A. S. Garmabaki ◽

Jagvinder Singh

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Imperfect Debugging ◽

Flexible software reliability growth model with testing effort dependent learning process

Applied Mathematical Modelling ◽

10.1016/j.apm.2007.04.002 ◽

2008 ◽

Vol 32 (7) ◽

pp. 1298-1307 ◽

Cited By ~ 49

Author(s):

P.K. Kapur ◽

D.N. Goswami ◽

Amit Bardhan ◽

Ompal Singh

Keyword(s):

Growth Model ◽

Learning Process ◽

Software Reliability ◽

Reliability Growth ◽

Testing Effort ◽

Dependent Learning

Software-reliability growth model: primary-failures generate secondary-faults under imperfect debugging

IEEE Transactions on Reliability ◽

10.1109/24.326435 ◽

1994 ◽

Vol 43 (3) ◽

pp. 408-413 ◽

Cited By ~ 37

Author(s):

P. Zeephongsekul ◽

G. Xia ◽

S. Kumar

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Imperfect Debugging ◽

2012 Second International Conference on Advanced Computing & Communication Technologies ◽

Flexible Discrete Software Reliability Growth Model for Distributed Environment Incorporating Two Types of Imperfect Debugging

10.1109/acct.2012.54 ◽

2012 ◽

Cited By ~ 4

Author(s):

Sunil Kumar Khatri ◽

P.K. Kapur ◽

Prashant Johri

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Distributed Environment ◽

Imperfect Debugging ◽

Electronics and Communications in Japan (Part III Fundamental Electronic Science) ◽

A testing-domain-dependent software reliability growth model for imperfect debugging environment and its evaluation of goodness-of-fit

10.1002/ecjc.10035 ◽

2002 ◽

Vol 86 (1) ◽

pp. 11-18 ◽

Cited By ~ 2

Author(s):

Takaji Fujiwara ◽

Shigeru Yamada

Keyword(s):

Growth Model ◽

Software Reliability ◽

Goodness Of Fit ◽

Reliability Growth ◽

Imperfect Debugging ◽

Proceedings of 1994 1st International Conference on Software Testing, Reliability and Quality Assurance (STRQA'94) ◽

A discrete software reliability growth model with testing effort

10.1109/strqa.1994.526379 ◽

2002 ◽

Cited By ~ 6

Author(s):

P.K. Kapur ◽

Min Xie ◽

R.B. Garg ◽

A.K. Jha

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Testing Effort ◽

Software-reliability growth model: primary-failures generate secondary-faults under imperfect debugging

Microelectronics Reliability ◽

10.1016/0026-2714(96)81958-5 ◽

1996 ◽

Vol 36 (3) ◽

pp. 446

Keyword(s):

Growth Model ◽

Software Reliability ◽

Reliability Growth ◽

Imperfect Debugging ◽