Busy-period analysis of a two-unit warm standby system with inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(84)90079-9 ◽

1984 ◽

Vol 24 (5) ◽

pp. 992

Keyword(s):

Busy Period ◽

Inspection Time ◽

Period Analysis ◽

Standby System ◽

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Busy-period analysis of a two-unit warm standby system with inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(83)90343-8 ◽

1983 ◽

Vol 23 (2) ◽

pp. 341-346 ◽

Author(s):

R. Subramanyam Naidu ◽

M.N. Gopalan

Keyword(s):

Busy Period ◽

Inspection Time ◽

Period Analysis ◽

Standby System ◽

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Busy period analysis of a two-unit warm standby system with imperfect switch

Microelectronics Reliability ◽

10.1016/0026-2714(85)90399-3 ◽

1985 ◽

Vol 25 (4) ◽

pp. 675-679 ◽

Author(s):

Rajiv Garg

Keyword(s):

Busy Period ◽

Period Analysis ◽

Standby System ◽

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Reliability analysis of two-unit warm standby system with partial failure mode and inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(92)90082-v ◽

1992 ◽

Vol 32 (1-2) ◽

pp. 17-19 ◽

Author(s):

D.K. Pandey ◽

S.M. Gupta ◽

N.K. Jaiswal

Keyword(s):

Reliability Analysis ◽

Failure Mode ◽

Inspection Time ◽

Partial Failure ◽

Standby System ◽

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Availability analysis of two-unit warm standby system with inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(81)90311-5 ◽

1981 ◽

Vol 21 (4) ◽

pp. 615

Keyword(s):

Inspection Time ◽

Availability Analysis ◽

Standby System ◽

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s-expected busy period of 1-server 2-unit warm standby system subject to different repair strategies

Microelectronics Reliability ◽

10.1016/0026-2714(82)90015-4 ◽

1982 ◽

Vol 22 (3) ◽

pp. 399-403 ◽

Author(s):

M.N. Gopalan ◽

J. Natesan

Keyword(s):

Busy Period ◽

Standby System ◽

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Availability analysis of two-unit warm standby system with inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(80)90588-0 ◽

1980 ◽

Vol 20 (4) ◽

pp. 449-455 ◽

Author(s):

Kouichi Adachi ◽

Masanori Kodama

Keyword(s):

Inspection Time ◽

Availability Analysis ◽

Standby System ◽

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Busy-period analysis of a one-server two-unit system subject to non-negligible inspection time

Microelectronics Reliability ◽

10.1016/0026-2714(83)91172-1 ◽

1983 ◽

Vol 23 (3) ◽

pp. 453-465 ◽

Author(s):

M.N. Gopalan ◽

R. Subramanyam Naidu

Keyword(s):

Busy Period ◽

Inspection Time ◽

Period Analysis ◽

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Busy period analysis of finite QBD processes

ACM SIGMETRICS Performance Evaluation Review ◽

10.1145/1453175.1453196 ◽

2008 ◽

Vol 36 (2) ◽

pp. 98-100 ◽

Author(s):

Chaitanya Garikiparthi ◽

Appie van de Liefvoort ◽

Ken Mitchell

Keyword(s):

Busy Period ◽

Period Analysis ◽

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Transient Busy Period Analysis of Initially Non-Empty M/G/l Queues—Lattice Path Approach

Advances in Combinatorial Methods and Applications to Probability and Statistics ◽

10.1007/978-1-4612-4140-9_18 ◽

1997 ◽

pp. 301-315 ◽

Author(s):

Kanwar Sen ◽

Manju Agarwal

Keyword(s):

Busy Period ◽

Lattice Path ◽

Period Analysis

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Queue Length and Busy Period Analysis for the M/G/1 Queue with Negative Arrivals

Indian Journal of Science and Technology ◽

10.17485/ijst/2015/v8i34/86273 ◽

2015 ◽

Vol 8 (34) ◽

Author(s):

Doo Ho Lee ◽

Hyun Min Park ◽

Dae-Eun Lim

Keyword(s):

Queue Length ◽

Busy Period ◽

Period Analysis ◽

Negative Arrivals

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