Simple IC tester using a database technique
1986 ◽
Vol 10
(3)
◽
pp. 161-168
◽
Keyword(s):
2017 ◽
Vol 96
(4)
◽
pp. 6473-6502
◽
Keyword(s):
2011 ◽
Vol 268-270
◽
pp. 1301-1306
Keyword(s):