Comparison of the optical, thermal and structural properties of Ge–Sb–S thin films deposited using thermal evaporation and pulsed laser deposition techniques

2011 ◽  
Vol 59 (12) ◽  
pp. 5032-5039 ◽  
Author(s):  
J.D. Musgraves ◽  
N. Carlie ◽  
J. Hu ◽  
L. Petit ◽  
A. Agarwal ◽  
...  
2011 ◽  
Vol 326 (1) ◽  
pp. 9-13 ◽  
Author(s):  
Se-Yun Kim ◽  
Sang-Yun Sung ◽  
Kwang-Min Jo ◽  
Joon-Hyung Lee ◽  
Jeong-Joo Kim ◽  
...  

2002 ◽  
Vol 720 ◽  
Author(s):  
Daniel Potrepka ◽  
Steven Tidrow ◽  
Arthur Tauber ◽  
Kevin Kirchner ◽  
Bernard Rod ◽  
...  

AbstractThin films were prepared from bulk targets by pulsed-laser deposition techniques. The targets were composed of Ba0.6Sr0.4TiO3 with charge-compensated substitutions for Ti4+. Results of the dielectric characterization measurements will be discussed and compared to the results of similar measurements in bulk materials with the same composition.


2016 ◽  
Vol 34 (2) ◽  
pp. 021505 ◽  
Author(s):  
Esteban Broitman ◽  
Francisco J. Flores-Ruiz ◽  
Massimo Di Giulio ◽  
Francisco Gontad ◽  
Antonella Lorusso ◽  
...  

1997 ◽  
Vol 19 (8-9) ◽  
pp. 1061-1068
Author(s):  
F. Fabbri ◽  
V. Boffa ◽  
T. Petrisor ◽  
R. Bruzzese ◽  
L. Ciontea ◽  
...  

2014 ◽  
Vol 117 (1) ◽  
pp. 31-35 ◽  
Author(s):  
L. Escobar-Alarcón ◽  
D. A. Solís-Casados ◽  
J. Perez-Alvarez ◽  
S. Romero ◽  
J. G. Morales-Mendez ◽  
...  

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