Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

2010 ◽  
Vol 178-179 ◽  
pp. 317-330 ◽  
Author(s):  
Andreas Oelsner ◽  
Martin Rohmer ◽  
Christian Schneider ◽  
Daniela Bayer ◽  
Gerd Schönhense ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Time Of Flight ◽  
Microscopy Imaging ◽  
Photoemission Electron Microscopy ◽  
Time And Energy ◽  
Photoemission Electron

Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis

2001 ◽  
Vol 480 (3) ◽  
pp. 180-187 ◽  
Author(s):  
G Schönhense ◽  
A Oelsner ◽  
O Schmidt ◽  
G.H Fecher ◽  
V Mergel ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Analysis ◽  
Time Of Flight ◽  
Photoemission Electron Microscopy ◽  
Chemical Surface ◽  
Photoemission Electron

Ultrafast Electron Cooling and Decay in Monolayer WS2 Revealed by Time- and Energy-Resolved Photoemission Electron Microscopy

Nano Letters ◽  
2020 ◽  
Vol 20 (5) ◽  
pp. 3747-3753 ◽  
Author(s):  
Yaolong Li ◽  
Wei Liu ◽  
Yunkun Wang ◽  
Zhaohang Xue ◽  
Yu-Chen Leng ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Cooling ◽  
Photoemission Electron Microscopy ◽  
Time And Energy ◽  
Photoemission Electron

High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon

2008 ◽  
Vol 230 (1) ◽  
pp. 42-47 ◽  
Author(s):  
M. HOVORKA ◽  
L. FRANK ◽  
D. VALDAITSEV ◽  
S.A. NEPIJKO ◽  
H.S. ELMERS ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Microscopy Imaging ◽  
Photoemission Electron Microscopy ◽  
Pass Energy ◽  
High Pass ◽  
Photoemission Electron
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