Generalized non-local surface susceptibility model and Fresnel coefficients for the characterization of periodic metafilms with bianisotropic scatterers

2015 ◽  
Vol 281 ◽  
pp. 251-268 ◽  
Author(s):  
Alexandros I. Dimitriadis ◽  
Nikolaos V. Kantartzis ◽  
Theodoros D. Tsiboukis ◽  
Christian Hafner
Keyword(s):  
Local Surface ◽  
Susceptibility Model ◽  
Non Local ◽  
Fresnel Coefficients

A robust and rotationally invariant local surface descriptor with applications to non-local mesh processing

2011 ◽  
Vol 73 (5) ◽  
pp. 231-242 ◽  
Author(s):  
A. Maximo ◽  
R. Patro ◽  
A. Varshney ◽  
R. Farias
Keyword(s):  
Local Surface ◽  
Mesh Processing ◽  
Non Local ◽  
Rotationally Invariant

scholarly journals Experimental characterization of a non-local convertor for quantum photonic networks

2017 ◽  
Vol 25 (7) ◽  
pp. 7839 ◽  
Author(s):  
Michal Mičuda ◽  
Robert Stárek ◽  
Petr Marek ◽  
Martina Miková ◽  
Ivo Straka ◽  
...  
Keyword(s):  
Experimental Characterization ◽  
Photonic Networks ◽  
Non Local

scholarly journals Necessary optimality conditions of a reaction-diffusion SIR model with ABC fractional derivatives

2021 ◽  
Vol 0 (0) ◽  
pp. 0
Author(s):  
Moulay Rchid Sidi Ammi ◽  
Mostafa Tahiri ◽  
Delfim F. M. Torres
Keyword(s):  
Optimal Control ◽  
Fractional Derivative ◽  
Optimality Conditions ◽  
Fractional Derivatives ◽  
Necessary Optimality Conditions ◽  
Reaction Diffusion ◽  
Derivative Operator ◽  
Sir Epidemic ◽  
Non Local

<p style='text-indent:20px;'>The main aim of the present work is to study and analyze a reaction-diffusion fractional version of the SIR epidemic mathematical model by means of the non-local and non-singular ABC fractional derivative operator with complete memory effects. Existence and uniqueness of solution for the proposed fractional model is proved. Existence of an optimal control is also established. Then, necessary optimality conditions are derived. As a consequence, a characterization of the optimal control is given. Lastly, numerical results are given with the aim to show the effectiveness of the proposed control strategy, which provides significant results using the AB fractional derivative operator in the Caputo sense, comparing it with the classical integer one. The results show the importance of choosing very well the fractional characterization of the order of the operators.</p>

Global dynamics and spreading speeds for a partially degenerate system with non-local dispersal in periodic habitats

2018 ◽  
Vol 148 (4) ◽  
pp. 849-880 ◽  
Author(s):  
Jia-Bing Wang ◽  
Wan-Tong Li ◽  
Jian-Wen Sun
Keyword(s):  
Eigenvalue Problem ◽  
Principal Eigenvalue ◽  
Reaction Diffusion ◽  
Degenerate System ◽  
Global Dynamics ◽  
Spreading Speeds ◽  
Monostable Nonlinearity ◽  
Non Local ◽  
Local Dispersal

This paper is concerned with the global dynamics and spreading speeds of a partially degenerate non-local dispersal system with monostable nonlinearity in periodic habitats. We first obtain the existence of the principal eigenvalue for a periodic eigenvalue problem with partially degenerate non-local dispersal. Then we study the coexistence and extinction dynamics. Finally, the existence and characterization of spreading speeds are considered. In particular, we show that the spreading speed is linearly determinate. Overall, we extend the existing results on global dynamics and spreading speeds for the degenerate reaction–diffusion system to the degenerate non-local dispersal case. The extension is non-trivial and meaningful.

The Application of Motif Characterizing Method in the Surface Topography Evaluation of MEMS Device

2007 ◽  
Vol 364-366 ◽  
pp. 210-214
Author(s):  
Sheng Hua Wang ◽  
Tie Bang Xie ◽  
Xu Dong Yang
Keyword(s):  
Surface Topography ◽  
Reference Region ◽  
Local Surface ◽  
Bonding Technology ◽  
Mems Device

The surface topography characterization of MEMS device is very important to bonding technology of MEMS device. Motif characterizing method is a characterizing method of surface topography by graph. Aiming at the diversity and regionality of surface topography of MEMS device, in this study we have sampled the surface of MEMS device by 3-dimentinal grids using the surface profiler developed by us and characterizes the surface topography of MEMS device by the extended Motif characterizing method. The surface of MEMS device is divided into several Motif regions; the surface topography of every divided region can be evaluated respectively; the details of every region can be zoomed and these regions as a whole or every region can be revolved and projected; one of these regions can be as the reference of other regions. So the height, gradient and other characteristics of others regions of the whole MEMS device surface can be analyzed relative to the reference region; the whole and local surface topography of whole MEMS device can be analyzed.

Sign in / Sign up

Export Citation Format

Share Document