TMC(100) surface relaxation studied with low-energy-electron-diffraction intensity analysis

2002 ◽  
Vol 517 (1-3) ◽  
pp. 59-64 ◽  
Author(s):  
M. Tagawa ◽  
T. Kawasaki ◽  
C. Oshima ◽  
S. Otani ◽  
K. Edamoto ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Relaxation ◽  
Intensity Analysis ◽  
Diffraction Intensity ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

ATOMIC STRUCTURE OF Si(113) 3×1-H BY DYNAMICAL LOW-ENERGY ELECTRON DIFFRACTION INTENSITY SPECTRA ANALYSIS

1994 ◽  
Vol 01 (02n03) ◽  
pp. 221-227 ◽  
Author(s):  
H. HUANG ◽  
S.Y. TONG ◽  
U. MYLER ◽  
K. JACOBI
Keyword(s):  
Electron Diffraction ◽  
Three Dimensional ◽  
Low Energy ◽  
Energy Electron ◽  
Intensity Analysis ◽  
Diffraction Intensity ◽  
Spectra Analysis ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Atomic Coordinates

The Si ((113) 3×1-H structure has been investigated by a quantitative low-energy electron diffraction intensity analysis. A model with two Si dimers in the unit cell gives best agreement between the calculation and the experimental data. Three-dimensional atomic coordinates have been determined.

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