scholarly journals Aberration-Corrected STEM Image Simulation of Segregation in Pt3Co Nanoparticles for PEM Fuel Cells

2010 ◽  
Vol 16 (S2) ◽  
pp. 252-253
Author(s):  
BN Patrick ◽  
LF Allard ◽  
Y Shao-Horn ◽  
PJ Ferreira
Keyword(s):  
Fuel Cells ◽  
Pem Fuel Cells ◽  
Image Simulation ◽  
Stem Image ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals On the Degradation of PtNi nanocatalysts for PEM Fuel Cells: An Identical Location Aberration-corrected STEM Study

2016 ◽  
Vol 22 (S3) ◽  
pp. 1358-1359 ◽  
Author(s):  
Somaye Rasouli ◽  
Tsuyohiko Fujigaya ◽  
Deborah Myers ◽  
Naotoshi Nakashima ◽  
Paulo Ferreira
Keyword(s):  
Fuel Cells ◽  
Pem Fuel Cells ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Aberration-Corrected STEM Study on Pt0.8Ni De-alloyed Nanocatalysts for Proton Exchange Membrane Fuel Cells

2014 ◽  
Vol 20 (S3) ◽  
pp. 480-481
Author(s):  
Somaye Rasouli ◽  
Jonathan Sharman ◽  
Alex Martinez ◽  
Dash Fongalland ◽  
Graham Hards ◽  
...  
Keyword(s):  
Fuel Cells ◽  
Proton Exchange Membrane ◽  
Proton Exchange ◽  
Aberration Corrected Stem ◽  
Exchange Membrane ◽  
Aberration Corrected

scholarly journals Uncovering Structure-Properties Relations in Fuel Cells and Catalysts with Quantitative Aberration-Corrected STEM and EELS

2014 ◽  
Vol 20 (S3) ◽  
pp. 484-485
Author(s):  
Jae Hyuck Jang ◽  
Qian He ◽  
Young-Min Kim ◽  
Donovan N. Leonard ◽  
Amit Kumar ◽  
...  
Keyword(s):  
Fuel Cells ◽  
Aberration Corrected Stem ◽  
Aberration Corrected ◽  
Structure Properties

Atomic Structure and Composition of “Pt3Co” Nanocatalysts in Fuel Cells: An Aberration-Corrected STEM HAADF Study

2013 ◽  
Vol 25 (4) ◽  
pp. 530-535 ◽  
Author(s):  
Brian Patrick ◽  
Hyung Chul Ham ◽  
Yang Shao-Horn ◽  
Lawrence F. Allard ◽  
Gyeong S. Hwang ◽  
...  
Keyword(s):  
Fuel Cells ◽  
Atomic Structure ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Simulation of high-resolution annular dark field STEM images

1995 ◽  
Vol 53 ◽  
pp. 40-41
Author(s):  
E. J. Kirkland
Keyword(s):  
Electron Beam ◽  
Atomic Layer ◽  
Fresnel Diffraction ◽  
Dark Field ◽  
Objective Lens ◽  
Image Simulation ◽  
Small Probe ◽  
Annular Dark Field ◽  
Stem Image ◽  
Uniform Plane

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.

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