scholarly journals The Role of Aberration-Corrected STEM in the Characterization of Oxide Cathode Materials

2015 ◽  
Vol 21 (S3) ◽  
pp. 1547-1548
Author(s):  
P.J. Phillips ◽  
D.P. Abraham ◽  
J. Bareno ◽  
C. Kim ◽  
T. Yi ◽  
...  
2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
SH Oh ◽  
K van Benthem ◽  
SI Molina ◽  
P Werner ◽  
D Kumar ◽  
...  

2015 ◽  
Vol 21 (S3) ◽  
pp. 1305-1306
Author(s):  
HsinWei Wu ◽  
Toshihiro Aoki ◽  
Agham B. Posadas ◽  
Alexander A. Demkov ◽  
David J. Smith

2012 ◽  
Vol 18 (S2) ◽  
pp. 1484-1485 ◽  
Author(s):  
K. Jarvis ◽  
Z. Deng ◽  
A. Manthiram ◽  
P. Ferreira

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


Nano Letters ◽  
2012 ◽  
Vol 12 (6) ◽  
pp. 2732-2739 ◽  
Author(s):  
Santhana K. Eswara Moorthy ◽  
Olivier Rousseau ◽  
Michel Viret ◽  
Mathieu Kociak

2017 ◽  
Vol 110 (25) ◽  
pp. 252901 ◽  
Author(s):  
HsinWei Wu ◽  
Sirong Lu ◽  
Toshihiro Aoki ◽  
Patrick Ponath ◽  
John G. Ekerdt ◽  
...  

2012 ◽  
Vol 18 (S2) ◽  
pp. 354-355
Author(s):  
J. Liu

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


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