Reversible Defect Engineering of Single-Walled Carbon Nanotubes Using Scanning Tunneling Microscopy

Nano Letters ◽  
2007 ◽  
Vol 7 (12) ◽  
pp. 3623-3627 ◽  
Author(s):  
Maxime Berthe ◽  
Shoji Yoshida ◽  
Yuta Ebine ◽  
Ken Kanazawa ◽  
Arifumi Okada ◽  
...  
2006 ◽  
Vol 12 (S02) ◽  
pp. 554-555
Author(s):  
IH Musselman ◽  
VZ Poenitzsch ◽  
GR Dieckmann

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


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