A Robust Feature Extraction and Parameterized Fitting Algorithm for Bottom-Side Oblique and Vertical Incidence Ionograms
2007 ◽
Vol 15
(1)
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pp. 224-234
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2011 ◽
Vol 19
(8)
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pp. 1921-1930
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2020 ◽
Vol 79
(29-30)
◽
pp. 21487-21512
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