Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

2013 ◽  
Vol 113 (1) ◽  
pp. 014307 ◽  
Author(s):  
Kohei Yamasue ◽  
Yasuo Cho
Keyword(s):  
Dipole Moment ◽  
Simultaneous Measurement ◽  
Tunneling Current ◽  
Nonlinear Dielectric ◽  
Atomic Dipole ◽  
Atomic Dipole Moment

Nonresonant interaction of a three-level atom with cavity fields. IV. Atomic dipole moment and squeezing effects

1989 ◽  
Vol 40 (1) ◽  
pp. 228-236 ◽  
Author(s):  
Xiao-shen Li ◽  
D. L. Lin ◽  
Thomas F. George ◽  
Zhen-dong Liu
Keyword(s):  
Dipole Moment ◽  
Level Atom ◽  
Atomic Dipole ◽  
Atomic Dipole Moment

Simultaneous Observation of Surface Morphology and Dielectric Properties Using Non-Contact Scanning Nonlinear Dielectric Microscopy with Atomic Resolution

2006 ◽  
Vol 966 ◽  
Author(s):  
Ryusuke Hirose ◽  
Yasuo Cho
Keyword(s):  
Dielectric Constant ◽  
Dipole Moment ◽  
Tunneling Current ◽  
Atomic Resolution ◽  
Control Technique ◽  
Simultaneous Observation ◽  
Nonlinear Dielectric ◽  
Height Control ◽  
Moment Distribution ◽  
Microscopy Techniques

ABSTRACTRecently, we have developed Non-Contact Scanning Nonlinear Dielectric Microscopy (NC-SNDM) with a new height-control technique utilizing higher order nonlinear dielectric constant detection (ε(4) signal). In theoretically, NC-SNDM has quite high height sensitivity against the gap between tip and sample as well as STM technique and the simultaneous observation of the topography and ferroelectric polarization (local dipole moment) distribution with atomic resolution has been expected. To confirm such performance of NC-SNDM with atomic resolution, UHV-SNDM was developed and Si(111) cleaned surface was chosen as a specimen. As a result, we have succeeded in observing Si(111) 7×7 atomic structure. Moreover, distribution of tunneling current and lowest order nonlinear dielectric signal ε(3) could be observed simultaneously. To the best our knowledge, this is the first successful demonstration of the atomic resolution achievement in dielectric microscopy techniques.

Laser-Phase-Noise-Induced Stochastic-Resonance Fluorescence

1997 ◽  
Vol 52 (1-2) ◽  
pp. 127-129 ◽  
Author(s):  
Chang Su ◽  
A.A. Rangwala ◽  
K. Wódkiewicz
Keyword(s):  
Dipole Moment ◽  
Phase Noise ◽  
Fluorescence Intensity ◽  
Laser Linewidth ◽  
Resonance Fluorescence ◽  
Laser Noise ◽  
Stochastic Fluctuations ◽  
Triplet Structure ◽  
Atomic Dipole ◽  
Atomic Dipole Moment

Abstract Stochastic fluctuations of coherent and incoherent components of the resonance fluorescence intensity induced by Wiener-Levy laser phase noise are investigated. Statistical properties of the atomic dipole moment and stochastic Mollow spectra of atomic dipole fluctuations for different values of the laser linewidth and Rabi frequency are calculated. It is shown that these spectra exhibit a triplet structure which is purely classical and entirely laser-noise dependent.

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