scholarly journals Multicritical points and topology-induced inverse transition in the random-field Blume-Capel model in a random network

2017 ◽  
Vol 95 (6) ◽  
Author(s):  
R. Erichsen ◽  
Amanda Azevedo Lopes ◽  
S. G. Magalhaes
Keyword(s):  
Random Field ◽  
Random Network ◽  
And Topology ◽  
Multicritical Points ◽  
Inverse Transition

The Anisotropic van Hemmen model with a random field in a random network

2020 ◽  
Vol 545 ◽  
pp. 123267
Author(s):  
Alexandre Silveira ◽  
S.G. Magalhaes ◽  
R. Erichsen
Keyword(s):  
Random Field ◽  
Random Network

scholarly journals Multicritical points in an Ising random-field model

1986 ◽  
Vol 34 (7) ◽  
pp. 4766-4770 ◽  
Author(s):  
Miron Kaufman ◽  
Philip E. Klunzinger ◽  
A. Khurana
Keyword(s):  
Random Field ◽  
Field Model ◽  
Random Field Model ◽  
Multicritical Points

scholarly journals Ising spin glass in a random network with a Gaussian random field

2021 ◽  
Vol 103 (2) ◽  
Author(s):  
R. Erichsen ◽  
A. Silveira ◽  
S. G. Magalhaes
Keyword(s):  
Random Field ◽  
Spin Glass ◽  
Random Network ◽  
Gaussian Random Field ◽  
Ising Spin Glass ◽  
Ising Spin

Application of Lattice Imaging Techniques to Amorphous Films

1975 ◽  
Vol 33 ◽  
pp. 8-9
Author(s):  
S. R. Herd ◽  
P. Chaudhari
Keyword(s):  
Nearest Neighbor ◽  
Random Network ◽  
Imaging Techniques ◽  
Network Models ◽  
Accurate Method ◽  
Direct Transmission ◽  
Lattice Imaging ◽  
Transmission Electron ◽  
Lattice Planes ◽  
Nearest Neighbor Distances

Electron diffraction and direct transmission have been used extensively to study the local atomic arrangement in amorphous solids and in particular Ge. Nearest neighbor distances had been calculated from E.D. profiles and the results have been interpreted in terms of the microcrystalline or the random network models. Direct transmission electron microscopy appears the most direct and accurate method to resolve this issue since the spacial resolution of the better instruments are of the order of 3Å. In particular the tilted beam interference method is used regularly to show fringes corresponding to 1.5 to 3Å lattice planes in crystals as resolution tests.

Geometry and Topology

2005 ◽  
Author(s):  
Miles Reid ◽  
Balazs Szendroi
Keyword(s):  
And Topology
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