A Fast and Robust Failure Analysis of Memory Circuits Using Adaptive Importance Sampling Method

Author(s):  
Xiao Shi ◽  
Fengyuan Liu ◽  
Jun Yang ◽  
Lei He
2015 ◽  
Vol 52 ◽  
pp. 161-169 ◽  
Author(s):  
Hongzhe Dai ◽  
Hao Zhang ◽  
Kim J.R. Rasmussen ◽  
Wei Wang

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