5G Ultra-Reliable Low-Latency Communication for Factory Automation at Millimetre Wave Bands

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Kittipong Kittichokechai ◽  
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...  
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Nadia Brahmi ◽  
Osman N. C. Yilmaz ◽  
Ke Wang Helmersson ◽  
Shehzad A. Ashraf ◽  
Johan Torsner

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Osman N. C. Yilmaz ◽  
Y.-P. Eric Wang ◽  
Niklas A. Johansson ◽  
Nadia Brahmi ◽  
Shehzad A. Ashraf ◽  
...  

2021 ◽  
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Karthik Krishnegowda ◽  
Elias L. Peter ◽  
Matthias Scheide ◽  
Lara Wimmer ◽  
Rudiger Kays ◽  
...  

1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER

1997 ◽  
Vol 92 (2) ◽  
pp. 229-236 ◽  
Author(s):  
M. HEPP ◽  
R. GENDRIESCH ◽  
I. PAK ◽  
Y.A. KURITSYN ◽  
F. LEWEN ◽  
...  

1989 ◽  
Vol 136 (6) ◽  
pp. 487
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S.J. Xu ◽  
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Keyword(s):  

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Masaya Yoshikawa

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Vol 783 ◽  
Author(s):  
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This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.


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