A FSM-based Test Sequence Generation Method for RPL Conformance Testing

2013 IEEE International Conference on Green Computing and Communications and IEEE Internet of Things and IEEE Cyber, Physical and Social Computing ◽

10.1109/greencom-ithings-cpscom.2013.111 ◽

2013 ◽

Author(s):

Jun Tang ◽

Xiaohong Huang ◽

Jing Qian ◽

Cesar Viho

Keyword(s):

Conformance Testing ◽

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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Test sequence generation for protocol conformance testing

[Proceedings] Singapore ICCS/ISITA `92 ◽

10.1109/iccs.1992.254980 ◽

2003 ◽

Author(s):

Tong Su ◽

Junliang Chen ◽

Shiduan Cheng

Keyword(s):

Conformance Testing ◽

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation ◽

Protocol Conformance Testing

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Comparative Analysis of Protocol Test Sequence Generation Methods for Conformance Testing

The Journal of Korea Institute of Information Electronics and Communication Technology ◽

10.17661/jkiiect.2017.10.4.325 ◽

2017 ◽

Vol 10 (4) ◽

pp. 325-332

Author(s):

Chul Kim

Keyword(s):

Comparative Analysis ◽

Conformance Testing ◽

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation ◽

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Test Sequence Generation Based on Chain Unique Input-Output Sequence in FSM Conformance Testing

10.1145/3494885.3494901 ◽

2021 ◽

Author(s):

Weiwei Lin ◽

Hongwei Zeng

Keyword(s):

Conformance Testing ◽

Test Sequence ◽

Input Output ◽

Output Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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Test sequence generation methods for protocol conformance testing

Proceedings Eighteenth Annual International Computer Software and Applications Conference (COMPSAC 94) ◽

10.1109/cmpsac.1994.342812 ◽

2002 ◽

Author(s):

Chul Kim ◽

J.S. Song

Keyword(s):

Conformance Testing ◽

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation ◽

Protocol Conformance Testing

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Test Sequence Generation for Java7 Fork/Join Using Interference Dependence

Journal on Today s Ideas-Tomorrow s Technologies ◽

10.15415/jotitt.2014.21001 ◽

2014 ◽

Vol 2 (1) ◽

pp. 1-12 ◽

Author(s):

Vipin Verma ◽

Vinay Arora

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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Safety requirement oriented test sequence generation algorithm for safety communication protocol

Journal of Computer Applications ◽

10.3724/sp.j.1087.2009.01828 ◽

2009 ◽

Vol 29 (7) ◽

pp. 1828-1831

Author(s):

Yi-qiang LI ◽

Zhong-wei XU ◽

Gang YU ◽

Yuan TAN

Keyword(s):

Communication Protocol ◽

Test Sequence ◽

Safety Requirement ◽

Safety Communication ◽

Generation Algorithm ◽

Sequence Generation ◽

Test Sequence Generation

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An Automatic Test Sequence Generation Method Based on Markov Chain Model

2021 World Conference on Computing and Communication Technologies (WCCCT) ◽

10.1109/wccct52091.2021.00024 ◽

2021 ◽

Author(s):

Liting Sun ◽

Shiwei Gao ◽

Lin Wang

Keyword(s):

Markov Chain ◽

Markov Chain Model ◽

Test Sequence ◽

Chain Model ◽

Automatic Test ◽

Sequence Generation ◽

Test Sequence Generation

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Test-sequence generation from formal requirement models

Proceedings Sixth IEEE International Symposium on High Assurance Systems Engineering. Special Topic: Impact of Networking ◽

10.1109/hase.2001.966804 ◽

2002 ◽

Author(s):

S. Rayadurgam ◽

M.P.E. Heimdahl

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Formal Requirement ◽

Test Sequence Generation ◽

Requirement Models

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SealTest: a simple library for test sequence generation

Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis - ISSTA 2017 ◽

10.1145/3092703.3098229 ◽

2017 ◽

Author(s):

Sylvain Hallé ◽

Raphaël Khoury

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences

Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 ◽

10.1145/309847.310052 ◽

1999 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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