scholarly journals Reconstruction Regularized Deep Metric Learning for Multi-Label Image Classification

Author(s):  
Changsheng Li ◽  
Chong Liu ◽  
Lixin Duan ◽  
Peng Gao ◽  
Kai Zheng
IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 53266-53275
Author(s):  
Anabik Pal ◽  
Zhiyun Xue ◽  
Brian Befano ◽  
Ana Cecilia Rodriguez ◽  
L. Rodney Long ◽  
...  

2020 ◽  
Author(s):  
Yuki Takashima ◽  
Ryoichi Takashima ◽  
Tetsuya Takiguchi ◽  
Yasuo Ariki

Sign in / Sign up

Export Citation Format

Share Document