Diode laser noise-spectroscopy of low-frequency atomic fluctuations in rubidium vapor

2008 ◽  
Vol 50 (2) ◽  
pp. 133-140 ◽  
Author(s):  
P. Valente ◽  
H. Failache ◽  
A. Lezama
Keyword(s):  
Diode Laser ◽  
Low Frequency ◽  
Rubidium Vapor ◽  
Laser Noise ◽  
Noise Spectroscopy

Diode-laser noise spectroscopy of rubidium

1993 ◽  
Vol 18 (21) ◽  
pp. 1816 ◽  
Author(s):  
D. H. McIntyre ◽  
J. Cooper ◽  
R. Walser ◽  
C. E. Fairchild
Keyword(s):  
Diode Laser ◽  
Laser Noise ◽  
Noise Spectroscopy

Study of 14.9 MeV Neutron Irradiation Effects on Ni/GaN Schottky Contacts Using Low‐Frequency Noise Spectroscopy

2019 ◽  
Vol 217 (7) ◽  
pp. 1900701
Author(s):  
Yuan Ren ◽  
Leidang Zhou ◽  
Kang Zhang ◽  
Liang Chen ◽  
Xiaoping Ouyang ◽  
...  
Keyword(s):  
Neutron Irradiation ◽  
Low Frequency ◽  
Schottky Contacts ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Irradiation Effects ◽  
Noise Spectroscopy

Diode-laser-noise-based spectroscopy of allowed and crossover resonances

1995 ◽  
Vol 52 (5) ◽  
pp. 4159-4166 ◽  
Author(s):  
K. V. Vasavada ◽  
Gautam Vemuri ◽  
G. S. Agarwal
Keyword(s):  
Diode Laser ◽  
Laser Noise

Spectroscopy with diode-laser noise

1998 ◽  
Vol 146 (1-6) ◽  
pp. 158-162 ◽  
Author(s):  
M. Rosenbluh ◽  
A. Rosenhouse-Dantsker ◽  
A.D. Wilson-Gordon ◽  
M.D. Levenson ◽  
R. Walser
Keyword(s):  
Diode Laser ◽  
Laser Noise

Low Frequency Noise Spectroscopy for Schottky Contacts

2000 ◽  
Vol 37 (6) ◽  
pp. 966 ◽  
Author(s):  
Lee J. I. ◽  
Han I .K. ◽  
Heo D. C. ◽  
Brini J. ◽  
Chovet A. ◽  
...  
Keyword(s):  
Low Frequency ◽  
Schottky Contacts ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Low-Frequency Noise Spectroscopy Characterization of HgCdTe Infrared Detectors

2020 ◽  
Vol 67 (2) ◽  
pp. 547-551 ◽  
Author(s):  
Liqi Zhu ◽  
Jian Huang ◽  
Zongheng Xie ◽  
Zhuo Deng ◽  
Lu Chen ◽  
...  
Keyword(s):  
Infrared Detectors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

scholarly journals Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
Jiří Vanek ◽  
Jan Dolensky ◽  
Zdenek Chobola ◽  
Mirek Luňák ◽  
Aleš Poruba
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Conversion Efficiency ◽  
Low Frequency ◽  
Low Noise ◽  
Frequency Noise ◽  
Noise Spectral Density ◽  
Selective Emitter ◽  
Noise Spectroscopy ◽  
Cell Conversion

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/ftype and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.

Experimental stability diagram of a diode laser subject to weak phase-conjugate feedback from a rubidium vapor cell

1999 ◽  
Vol 35 (4) ◽  
pp. 577-582 ◽  
Author(s):  
O.K. Andersen ◽  
A.P.A. Fischer ◽  
I.C. Lane ◽  
E. Louvergneaux ◽  
S. Stolte ◽  
...  
Keyword(s):  
Diode Laser ◽  
Stability Diagram ◽  
Rubidium Vapor ◽  
Phase Conjugate ◽  
Vapor Cell ◽  
Weak Phase
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