Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry

Field Displacement ◽

Wavelength Scanning

2012 International Conference on Computer Science and Information Processing (CSIP) ◽

Out of plane displacement measurement based on electronic speckle pattern interferometry

10.1109/csip.2012.6309106 ◽

2012 ◽

Author(s):

Fei Guo ◽

Maiyu Zhou ◽

Mei Zhao ◽

Yufang Sha ◽

Peng Li

Keyword(s):

Speckle Pattern ◽

Out Of Plane ◽

The Three-Dimensional Displacement Measurement of Sandwich Circular Plates With a Single Fully-Potted Insert Using Electronic Speckle Pattern Interferometry

Experimental Analysis of Nano and Engineering Materials and Structures ◽

10.1007/978-1-4020-6239-1_305 ◽

2007 ◽

pp. 615-616

Author(s):

Song-Jeng Huang ◽

Hung-Jen Yeh

Keyword(s):

Speckle Pattern ◽

Three Dimensional ◽

Circular Plates

In-plane displacement measurement using electronic-speckle-pattern-interferometry-based on spatial fringe analysis method

Optical Engineering ◽

10.1117/1.1778731 ◽

2004 ◽

Vol 43 (9) ◽

pp. 2168 ◽

Cited By ~ 32

Author(s):

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Analysis Method ◽

Fringe Analysis ◽

In-plane displacement measurement on rotating components using pulsed laser ESPI (electronic speckle pattern interferometry)

10.1117/12.26094 ◽

1991 ◽

Author(s):

Richard W. T. Preater

Keyword(s):

Speckle Pattern ◽

Pulsed Laser ◽

Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement

Optics Communications ◽

10.1016/s0030-4018(02)01556-0 ◽

2002 ◽

Vol 208 (1-3) ◽

pp. 17-24 ◽

Cited By ~ 5

Author(s):

R.A Martı́nez-Celorio ◽

B Barrientos ◽

Francisco J Sanchez-Marı́n ◽

Luis Martı́ López ◽

J.A Rayas

Keyword(s):

Speckle Pattern ◽

Out Of Plane ◽

Depth-resolved whole-field displacement measurement using wavelength scanning interferometry

Journal of Optics A Pure and Applied Optics ◽

10.1088/1464-4258/6/7/004 ◽

2004 ◽

Vol 6 (7) ◽

pp. 679-683 ◽

Cited By ~ 21

Author(s):

Pablo D Ruiz ◽

Yanzhou Zhou ◽

Jonathan M Huntley ◽

Ricky D Wildman

Keyword(s):

Field Displacement ◽

Wavelength Scanning

A Novel Fiber Illumination System for In-plane Displacement Measurement in Electronic Speckle Pattern Interferometry

Interferometry in Speckle Light ◽

10.1007/978-3-642-57323-1_33 ◽

2000 ◽

pp. 267-274

Author(s):

D. Rodriguez ◽

M. Dapena ◽

M. Gallas ◽

M. T. Abeleira ◽

D. Suárez ◽

...

Keyword(s):

Speckle Pattern ◽

Illumination System ◽

Electronic speckle pattern interferometry applied to the displacement measurement of sandwich plates with two ‘fully potted’ inserts

Composite Structures ◽

10.1016/j.compstruct.2005.07.008 ◽

2007 ◽

Vol 79 (2) ◽

pp. 157-162 ◽

Cited By ~ 8

Author(s):

Song-Jeng Huang ◽

Hwa-Long Lin ◽

Hsiao-Wei Liu

Keyword(s):

Speckle Pattern ◽

Sandwich Plates

Electronic speckle pattern interferometry applied to the displacement measurement of sandwich plates with double fully potted inserts

10.1117/12.621535 ◽

2005 ◽

Author(s):

Song-Jeng Huang ◽

Hwa-Long Lin

Keyword(s):

Speckle Pattern ◽

Sandwich Plates

Misalignment analysis in a phase-stepping electronic speckle pattern interferometer for full-field displacement measurement

10.1117/12.2013423 ◽

2013 ◽

Author(s):

A. Baldjiev ◽

E. Stoykova ◽

V. Sainov

Keyword(s):

Speckle Pattern ◽

Full Field ◽

Phase Stepping ◽

Field Displacement